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Approaches to the description of optical surface microtopography
https://doi.org/10.17586/0021-3454-2025-68-10-910-913
Abstract
The necessity of using a physical fractal model in regulatory and design documents for optical surfaces is substantiated, as this allows an adequate assessment of energy losses associated with radiation scattering. The expediency of switching from two-dimensional to three-dimensional measurements in the normalization and determination of roughness is noted.
About the Authors
V. M. Medunetsky
ITMO University
Russian Federation
Russian Federation
Viktor M. Medunetsky — Dr. Sci., Professor
St. Petersburg
S. V. Solk
Research Institute for Optoelectronic Instrument Engineering
Russian Federation
Russian Federation
Sergei V. Solk — Dr. Sci.; Deputy Head of Department
Leningrad region, Sosnovy Bor
L. A. Glushchenko
Scientific Research Institute for Optoelectronic Instrument Engineering
Russian Federation
Russian Federation
Larisa A. Glushchenko — PhD; Leading Researcher
Leningrad region, Sosnovy Bor
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Review
For citations:
Medunetsky V.M., Solk S.V., Glushchenko L.A. Approaches to the description of optical surface microtopography. Journal of Instrument Engineering. 2025;68(10):910-913. (In Russ.) https://doi.org/10.17586/0021-3454-2025-68-10-910-913
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