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Dependence of Optical Losses on the Thickness of the Buffer Layer Between a Thin-film Lithium Niobate Waveguide and a Metal Electrode

https://doi.org/10.17586/0021-3454-2025-68-4-310-319

Abstract

The optical losses in the intersection region of a gold electrode and a thin-film lithium niobate optical waveguide are investigated. It is possible to reduce the absorption of optical radiation in the waveguide by selecting the buffer layer thickness. Using the finite element method and the Mueller and Newton–Raphson numerical methods, the dependence of the optical losses in the waveguide on the buffer layer thickness is determined. It is shown that when the buffer layer thickness changes from zero to one micrometer, the optical losses in the intersection region of the waveguide and the electrode decrease from 6·102 to 10–3 dB/cm for the fundamental TM mode and from 102 to 10–3 dB/cm for the fundamental TE mode. The correctness of the calculation is confirmed by the consistency of the data obtained by three different methods. The results can be used in designing functional elements of photonic integrated circuits (phase, amplitude modulators, etc.) with minimal optical losses due to absorption of gold electrodes.

About the Authors

A. V. Bulatova
Perm National Research Polytechnic University; Perm Scientific-Industrial Instrument Making Company
Russian Federation

Anna V. Bulatova — Post-Graduate Student Department of General Physics; research engineer

Perm



D. N. Moskalev
Perm National Research Polytechnic University; Perm Scientific-Industrial Instrument Making Company; Perm State University
Russian Federation

Dmitriy N. Moscalev — M. Sc. Department of Nanotechnologies and Microsystem Technique; assistant, Department of General Physics; researcher; lead research engineer

Perm



U. O. Salgaeva
Skolkovo Institute of Science and Technology
Russian Federation

Ulyana O. Salgaeva — PhD expert

Moscow



V. A. Maksimenko
Perm National Research Polytechnic University
Russian Federation

Vitaly A. Maksimenko — PhD, Associate Professor  Department of General Physics

Perm



V. V. Krishtop
Perm National Research Polytechnic University; Perm Scientific-Industrial Instrument Making Company; Perm State University
Russian Federation

Victor V. Krishtop — Dr. Sci., Professor Department of General Physics, professor; Department of Nanotechnologies and Microsystem Technique, professor; chief scientist

Perm



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Review

For citations:


Bulatova A.V., Moskalev D.N., Salgaeva U.O., Maksimenko V.A., Krishtop V.V. Dependence of Optical Losses on the Thickness of the Buffer Layer Between a Thin-film Lithium Niobate Waveguide and a Metal Electrode. Journal of Instrument Engineering. 2025;68(4):310-319. (In Russ.) https://doi.org/10.17586/0021-3454-2025-68-4-310-319

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ISSN 0021-3454 (Print)
ISSN 2500-0381 (Online)