Methodology for effective computer modeling of a device for measuring light scattering properties
https://doi.org/10.17586/0021-3454-2023-66-11-936-949
Abstract
The problem of computer simulation of an optical system with light scattering elements is considered. Correctly modeling devices with such elements requires lengthy light calculations using stochastic ray tracers. An ap proach to efficient modeling of such installations is presented using the example of a patented device designed to meas ure the bidirectional scattering function, which is used to describe light scattering properties. A realistic computer model of such a device is proposed, which makes it possible to calculate tolerances for deviations in the positioning of the most critical device blocks, and an assessment of the accuracy of its measurements is carried out. Results of measurement simulations of bidirectional functions are presented in the form of graphs and synthesized images.
Keywords
computer simulation,
bidirectional scattering distribution function,
bidirectional reflectance distribution function,
bidirectional transmittance distribution function
Supporting agencies: this work was supported by the Russian Science Foundation, grant No. 22-11-00145
About the Authors
V. G. Sokolov
ITMO University
Russian Federation
Russian Federation
Vadim G. Sokolov, ITMO University, Faculty of Software Engineering and Computer Systems; Senior Researcher
St. Petersburg
I. S. Potemin
ITMO University
Russian Federation
Russian Federation
Igor S. Potemin, PhD; ITMO University, Faculty of Software Engineering and Computer Systems; Associated Professor
St. Petersburg
D. D. Zhdanov
ITMO University
Russian Federation
Russian Federation
Dmitry D. Zhdanov, PhD; ITMO University, Faculty of Software Engineering and Computer Systems; Associated Professor
St. Petersburg
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Review
For citations:
Sokolov V.G., Potemin I.S., Zhdanov D.D. Methodology for effective computer modeling of a device for measuring light scattering properties. Journal of Instrument Engineering. 2023;66(11):936-949. (In Russ.) https://doi.org/10.17586/0021-3454-2023-66-11-936-949
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